The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

Aug. 16, 2010
Applicants:

B. Thomas Adler, Sunnyvale, CA (US);

David L. Marvit, San Francisco, CA (US);

Jawahar Jain, Santa Clara, CA (US);

Inventors:

B. Thomas Adler, Sunnyvale, CA (US);

David L. Marvit, San Francisco, CA (US);

Jawahar Jain, Santa Clara, CA (US);

Assignee:

Fujitsu Limited, Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04Q 5/22 (2006.01); H04Q 9/00 (2006.01);
U.S. Cl.
CPC ...
H04Q 9/00 (2013.01); H04Q 2209/47 (2013.01);
Abstract

According to one embodiment of the present invention, a method for selecting metadata for sensor data streams may be provided. The method may include receiving a first sensor data stream associated with a user. The first data stream may be generated by one or more sensors co-located with the user. A plurality of tags that are each associated with one or more sensor value ranges may be accessed. A first tag may be selected from the plurality of tags according to a relationship between the first sensor data stream and the one or more sensor value ranges associated with the first tag. The method may further include facilitating reporting of the first tag.


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