The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2016
Filed:
Nov. 24, 2014
Altek Semiconductor Corporation, Hsinchu, TW;
Wen-Yan Chang, Miaoli County, TW;
Hong-Long Chou, Hsinchu County, TW;
Yi-Hong Tseng, Hsinchu, TW;
Tsan-Wei Wang, Taitung County, TW;
Che-Lun Chuang, Hsinchu, TW;
ALTEK SEMICONDUCTOR CORPORATION, Hsinchu, TW;
Abstract
An image processing system and a method for object-tracing are provided. The method includes: receiving a first wide field of view image and a first narrow field of view image, and determining a to-be-traced object therefrom and choosing one image therefrom for serving as a first output image; using an area size of the to-be-traced object in the first output image as a reference area; comparing the reference area with the area sizes of the to-be-traced object from a second wide field of view image and a second narrow field of view image respectively so as to determine one of that as a main image, and respectively zooming and deforming the main image and an area corresponding to the other image, and then fusing a zoomed and deformed second image as a second output image.