The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

Jan. 16, 2014
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Jinhyung Oh, Daejeon, KR;

Gwangzeen Ko, Daejeon, KR;

Igor Kim, Daejeon, KR;

Myung Sun Song, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 7/02 (2006.01); H04L 1/02 (2006.01); H04L 1/00 (2006.01); H04B 7/04 (2006.01); H04B 7/08 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0009 (2013.01); H04B 7/0456 (2013.01); H04B 7/086 (2013.01);
Abstract

An interference alignment method using multiple antennas in a multi-cell overlapped environment, includes: when at least one transmission and reception ends having at least one or more antennas communicate with each other, establishing at least one or more channels from the transmission end to the reception end. Further, the interference alignment method includes designing a processing filter for a transmission signal transmitted from the transmission end to the reception ends; and designing a processing filter for a reception signal that is received by the reception end.


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Oh, Jinhyung. (2016). Method for interference alignment using multiple antennas in overlapped multi-cell overlapped environment (U.S. Patent No. 9385834). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9385834

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