The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

May. 25, 2015
Applicant:

Realtek Semiconductor Corp., HsinChu, TW;

Inventor:

Ching-Chia Cheng, Hsinchu, TW;

Assignee:

Realtek Semiconductor Corp., Science Park, HsinChu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/21 (2015.01); H04B 1/30 (2006.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04B 17/21 (2015.01); H04B 1/30 (2013.01); H04L 27/2636 (2013.01);
Abstract

A method for calibrating mismatches of an in-phase signal path and a quadrature signal path of a transmitter, including: utilizing the receiver to receive at least a test signal via the first signal path and the second signal path, wherein each test signal possesses a specific frequency within a specific frequency band; calculating at least a calibration coefficient for each test signal respectively, so as to calibrate mismatch between the first signal path and the second signal path of the receiver with respect to the specific frequency corresponding to each test signal; deriving a tap coefficient of a calibration filter of a calibration filter unit according to the at least a calibration coefficient of each test signal; and utilizing the calibration filter unit to calibrate a received signal.


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