The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9384953 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 05, 2016

Filed:

Nov. 13, 2012
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventor:

Shinjiro Fujita, Kameoka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01); H01J 49/00 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/005 (2013.01); H01J 49/4215 (2013.01);
Abstract

A measurement condition memory stores a CID gas condition table indicating a relation between the scan speed of a mass scan by a front-stage quadrupole mass filter and a CID gas supply pressure. If the scan speed is high, an influence of a decrease in speed of ions due to collisions with a CID gas inside a collision cell is relatively large. An appropriate CID gas supply pressure that reduces the decay of a peak waveform on a mass spectrum and makes the ion intensity as high as possible is examined in advance for each scan speed, and is stored in advance. During measurement of a target sample, if a precursor ion scan measurement mode or the like is designated, a CID gas supply pressure corresponding to the currently set scan speed is obtained based on the CID gas condition table, and the CID gas supplier is controlled.


Find Patent Forward Citations

Fujita, Shinjiro. (2016). Tandem quadrupole mass spectrometer (U.S. Patent No. 9384953). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9384953

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