The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

Mar. 23, 2015
Applicant:

Politechnika Poznanska, Poznan, PL;

Inventors:

Marek Domanski, Poznan, PL;

Tomasz Grajek, Poznan, PL;

Krzysztof Klimaszewski, Murowana Goslina, PL;

Maciej Kurc, Poznan, PL;

Jakub Stankowski, Poznan, PL;

Robert Ratajczak, Lwowek, PL;

Krzysztof Wegner, Murowana Goslina, PL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/52 (2006.01); G06K 9/62 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/52 (2013.01); G06K 9/00771 (2013.01); G06K 9/4661 (2013.01); G06K 9/6201 (2013.01);
Abstract

A method for estimating a size of an object present on two images representing the same scene from different points of view, the method comprising: determining an AAM image model; matching the AAM image model to the images to find a set of parameters describing the shape of the model (p) and the appearance of the model (λ) for which minimal matching errors for both images occur; and estimating the size of the object based on the differences in locations of points of the AAM image model in the images. The image model is matched to both images mutually, i.e. by using information from both images.


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