The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

Jun. 11, 2014
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Steven Lansel, E. Palo Alto, CA (US);

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 13/00 (2006.01); G06T 7/20 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G02B 13/0015 (2013.01); G06T 7/20 (2013.01); H04N 5/2254 (2013.01);
Abstract

An apparatus for acquiring intensity and depth information images may comprise: an image sensing unit having first radiation-sensitive elements and groups of second radiation-sensitive elements in a flat or curved plane having at least two directions, the first radiation-sensitive elements and groups of second radiation-sensitive elements to receive, respectively, an intensity image and a depth information image, at least two groups of second elements extending in each of the two directions of the plane; first micro-lenses, each of which is arranged to convey radiation to a corresponding one of the first elements; and second micro-lenses, each of which is arranged to convey radiation to a corresponding group of the second elements.


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