The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

May. 03, 2011
Applicants:

Christopher B. Walker, Jr., St. Paul, MN (US);

Christopher P. Tebow, Woodbury, MN (US);

Tri D. Pham, Oakdale, MN (US);

Steven H. Kong, Woodbury, MN (US);

Joseph T. Aronson, Menomonie, WI (US);

Kyle J. Lindstrom, Houlton, WI (US);

Michael K. Gerlach, Huntsville, AL (US);

Michelle L. Toy, North St. Paul, MN (US);

Taun L. Mckenzie, Hugo, MN (US);

Anthony M. Renstrom, Maplewood, MN (US);

Robert A. Yapel, Oakdale, MN (US);

Mitchell A. F. Johnson, Maplewood, MN (US);

Inventors:

Christopher B. Walker, Jr., St. Paul, MN (US);

Christopher P. Tebow, Woodbury, MN (US);

Tri D. Pham, Oakdale, MN (US);

Steven H. Kong, Woodbury, MN (US);

Joseph T. Aronson, Menomonie, WI (US);

Kyle J. Lindstrom, Houlton, WI (US);

Michael K. Gerlach, Huntsville, AL (US);

Michelle L. Toy, North St. Paul, MN (US);

Taun L. McKenzie, Hugo, MN (US);

Anthony M. Renstrom, Maplewood, MN (US);

Robert A. Yapel, Oakdale, MN (US);

Mitchell A. F. Johnson, Maplewood, MN (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 1/118 (2015.01); G02B 5/02 (2006.01);
U.S. Cl.
CPC ...
G02B 1/118 (2013.01); G02B 5/0242 (2013.01);
Abstract

The present invention concerns antireflective films comprising a high refractive index layer () and low refractive index layer () disposed on the high refractive index layer. The antireflective films have a microstructured surface () that can be derived from a microreplicated tool.


Find Patent Forward Citations

Loading…