The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

May. 09, 2013
Applicant:

Chunlei Liu, Chapel Hill, NC (US);

Inventor:

Chunlei Liu, Chapel Hill, NC (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/54 (2006.01); A61B 5/055 (2006.01); G01R 33/48 (2006.01); A61B 5/00 (2006.01); G01R 33/24 (2006.01); G01R 33/563 (2006.01);
U.S. Cl.
CPC ...
G01R 33/54 (2013.01); A61B 5/0042 (2013.01); A61B 5/055 (2013.01); G01R 33/48 (2013.01); G01R 33/243 (2013.01); G01R 33/56383 (2013.01);
Abstract

The present disclosure provides a method and system for quantifying and making images of tissue anisotropy property based on magnetic resonance imaging (MRI). The systems and methods provided herein utilize orientation distribution of magnetic susceptibility to characterize magnetic susceptibility anisotropy (MSA) inside biological tissues. This MSA may be intrinsic property of the tissue or may be induced by the presence of external agents. In certain embodiments, the MSA is displayed as an orientation distribution function of susceptibility and/or may be described by mathematical quantities such as tensors (e.g., symmetric or asymmetric second order or higher order tensors) and spherical harmonics. In other embodiments, the MSA is characterized using a second order tensor named apparent susceptibility tensor (AST).


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