The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

Aug. 01, 2011
Applicants:

Natsuhiko Mizutani, Tokyo, JP;

Tetsuo Kobayashi, Kyoto, JP;

Inventors:

Natsuhiko Mizutani, Tokyo, JP;

Tetsuo Kobayashi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/26 (2006.01); G01R 33/022 (2006.01); G01R 33/028 (2006.01);
U.S. Cl.
CPC ...
G01R 33/26 (2013.01); G01R 33/022 (2013.01); G01R 33/028 (2013.01);
Abstract

A gradiometer in which a probe beam for reading sequentially passes through two magnetic field measurement regions to obtain signals according to magnetic flux densities of the respective regions is formed using an optically pumped magnetometer. In particular, in a gradiometer using a high sensitivity optically pumped magnetometer, a geometric arrangement enabling obtainment of a large signal from a dipole moment as a signal source is defined.


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