The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2016
Filed:
Jun. 19, 2012
Richard H. Bossi, Renton, WA (US);
Gary E. Georgeson, Tacoma, WA (US);
Clarence L. Gordon, Iii, Renton, WA (US);
Jeffrey R. Kollgaard, Seattle, WA (US);
William P. Motzer, Seattle, WA (US);
Alan Frank Stewart, Renton, WA (US);
Richard H. Bossi, Renton, WA (US);
Gary E. Georgeson, Tacoma, WA (US);
Clarence L. Gordon, III, Renton, WA (US);
Jeffrey R. Kollgaard, Seattle, WA (US);
William P. Motzer, Seattle, WA (US);
Alan Frank Stewart, Renton, WA (US);
THE BOEING COMPANY, Chicago, IL (US);
Abstract
A method and apparatus for inspecting a test object with a non-planar feature. A pattern of light is transmitted from a first array of optical fibers associated with a sensor structure onto a surface of the test object at a location of the non-planar feature. The pattern of light is configured to cause sound waves in the test object when the pattern of light encounters the test object. A response to the sound waves is detected using a second array of optical fibers associated with the sensor structure. A determination is made as to whether an inconsistency is present in the test object at the location of the non-planar feature from the response to the sound waves detected using the second array of optical fibers.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile