The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

Aug. 21, 2014
Applicants:

Dainippon Screen Mfg. Co., Ltd., Kyoto-shi, Kyoto, JP;

Osaka University, Suita-shi, Osaka, JP;

Inventors:

Hidetoshi Nakanishi, Kyoto, JP;

Akira Ito, Kyoto, JP;

Iwao Kawayama, Suita, JP;

Masayoshi Tonouchi, Suita, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6489 (2013.01); G01N 21/6456 (2013.01); G01N 2021/6417 (2013.01); G01N 2201/10 (2013.01);
Abstract

An inspection apparatus is an apparatus for inspecting a solar cell panel. The inspection apparatus includes: an excitation light irradiation part for irradiating the solar cell panel with pulsed light for causing the solar cell panel to radiate an electromagnetic wave pulse; a detection part for detecting the electromagnetic wave pulse radiated from the solar cell panel in response to irradiation with the pulsed light; and a temperature changing part for changing a temperature of the solar cell panel at a part irradiated with the pulsed light.


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