The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

Dec. 27, 2013
Applicant:

Industry-academic Cooperation Foundation, Yonsei University, Seoul, KR;

Inventors:

Dong Hyun Kim, Seoul, KR;

Won-ju Lee, Seoul, KR;

Youngjin Oh, Seoul, KR;

Jong-ryul Choi, Seoul, KR;

Taehwang Sohn, Gyeonggi-Do, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01);
Abstract

A super-resolved optical imaging apparatus and a super-resolved optical imaging method using the apparatus are disclosed. The optical imaging apparatus can includes: a light source unit configured to supply an incident beam; a nano-pattern chip having a plurality of nanostructures; a light adjustment system configured to change an incidence property of the incident beam in at least one of a horizontal direction and a depth direction such that surface plasmon resonance occurs in a localized area of the plurality of nanostructures; and an image detection unit configured to extract fluorescence signals generated by the surface plasmon resonance from a specimen positioned in the localized area and convert the fluorescence signals into an image.


Find Patent Forward Citations

Loading…