The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2016
Filed:
Nov. 04, 2013
Kabushiki Kaisha Toshiba, Tokyo, JP;
Yuta Itoh, Kanagawa, JP;
Akihito Seki, Kanagawa, JP;
Kenichi Shimoyama, Tokyo, JP;
Satoshi Ito, Kanagawa, JP;
Masaki Yamazaki, Tokyo, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
According to an embodiment, a measuring device includes a measuring unit, a capturing unit, an estimation unit, a calculator, and a detector. The estimation unit estimates, for each irradiated point, an estimated projection position on the image, using a direction and a distance of the irradiated point and calibration information based on calibration of a measuring unit and a capturing unit. The calculator calculates, for each irradiated point, an amount of change in reflection intensity and obtains a reflection intensity change point. The calculator calculates, for each estimated projection position, an amount of change in brightness and obtains a brightness change point. The detector detects a calibration shift between the measuring unit and the capturing unit by comparing the reflection intensity change point and the brightness change point.