The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2016
Filed:
Nov. 01, 2013
University of Kent, Canterbury, Kent, GB;
Adrian Podoleanu, Canterbury, GB;
Adrian Bradu, Faversham, GB;
UNIVERSITY OF KENT, Canterbury, Kent, GB;
Abstract
Real-time depth measurements in sensing in spectral domain interferometry and for en-face and cross section image production in optical coherence tomography can operate without any need to linearize the data to maximize the output signal and achieve the theoretical depth resolution. Novel interferometry is disclosed, where parameters of a master interferometer dictate the results in a slave interferometer. The master interferometer can be the same measuring interferometer used in two stages. The master interferometer parameters are at least optical path difference (OPD) or the speed of variation of the OPD in the master interferometer. Coherence gated data are produced from selected axial positions which can be from positive or negative optical path differences, in parallel, enabling generation of en-face (C-scan) OCT images simultaneously from several depths, free from mirror terms, and production of A-scans and B-scan OCT images using plural reflectivity values measured in parallel from different depths within A-scans.