The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

Aug. 10, 2012
Applicants:

Anongsack Paseuth, Itami, JP;

Susumu Okuno, Itami, JP;

Hideaki Kanaoka, Itami, JP;

Erika Iwai, Itami, JP;

Takahiro Ichikawa, Itami, JP;

Inventors:

Anongsack Paseuth, Itami, JP;

Susumu Okuno, Itami, JP;

Hideaki Kanaoka, Itami, JP;

Erika Iwai, Itami, JP;

Takahiro Ichikawa, Itami, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B23B 27/14 (2006.01); C23C 16/38 (2006.01); C23C 16/06 (2006.01); C23C 16/44 (2006.01);
U.S. Cl.
CPC ...
B23B 27/148 (2013.01); C23C 16/06 (2013.01); C23C 16/38 (2013.01); C23C 16/44 (2013.01); B23B 2224/00 (2013.01);
Abstract

A surface-coated cutting tool of the present invention includes a base material and a coating film formed on the base material. The coating film includes at least one TiBlayer. The TiBlayer has TC (100) that shows a maximum value in an orientation index TC (hkl), or has a ratio I (100)/I (101) of 1.2 or more between an X-ray diffraction intensity I (100) of a (100) plane and an X-ray diffraction intensity I (101) of a (101) plane.


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