The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2016
Filed:
May. 05, 2014
Applicant:
Alcon Research, Ltd., Fort Worth, TX (US);
Inventors:
John R. Underwood, Laguna Nigel, CA (US);
Jack Robert Auld, Laguna Nigel, CA (US);
John Christopher Huculak, Mission Viejo, CA (US);
Assignee:
Alcon Research, Ltd., Fort Worth, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61F 9/007 (2006.01); A61B 17/32 (2006.01); A61B 17/3207 (2006.01); A61B 17/00 (2006.01);
U.S. Cl.
CPC ...
A61F 9/00763 (2013.01); A61B 17/32002 (2013.01); A61B 17/320783 (2013.01); A61B 2017/00402 (2013.01); A61B 2017/320028 (2013.01); A61B 2217/005 (2013.01); Y10T 137/86839 (2015.04); Y10T 137/87217 (2015.04); Y10T 137/87233 (2015.04);
Abstract
Vitrectomy probes and system related thereto are disclosed herein. The disclosure describes various example vitrectomy probes having an adjustable cutting port size. Various example features are described for adjusting the size of the cutting port. Further, the disclosure provides examples for adjusting the size of the cutter port while the vitrectomy probe is in operation.