The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2016

Filed:

Jun. 01, 2015
Applicant:

Liming Xiu, Plano, TX (US);

Inventor:

Liming Xiu, Plano, TX (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G04F 10/00 (2006.01); H03K 21/02 (2006.01); G01S 7/486 (2006.01); G01S 7/526 (2006.01); G01S 7/285 (2006.01); H03L 7/191 (2006.01); H03K 23/42 (2006.01);
U.S. Cl.
CPC ...
H03K 21/026 (2013.01); G01S 7/285 (2013.01); G01S 7/4865 (2013.01); G01S 7/526 (2013.01); H03K 23/42 (2013.01); H03L 7/191 (2013.01);
Abstract

Circuits for measuring TOF between two electrical signals comprises 1) a slow TAF-DPS clock signal generator for generating a slow clock signal, a fast TAF-DPS clock signal generator for generating a fast clock signal, said slow TAF-DPS clock signal generator comprises a gated ring oscillator and a TAF-DPS frequency synthesizer, said fast TAF-DPS clock signal generator comprises a gated ring oscillator and a TAF-DPS frequency synthesizer; 2) a phase detector for receiving said slow and fast clock signals and detecting point-of-coincidence between said slow and fast clock signals; 3) a first digital counter driven by said slow clock signal for storing the number of slow clock cycles and a second digital counter driven by said fast clock signal for storing the number of fast clock cycles; 4) a calibrator for calibrating said gate ring oscillators; 5) a calculation block for calculating TOF measurement result. Methods of using a slow TAF-DPS clock generator and a fast TAF-DPS clock generator for measuring TOF between two electrical signals are also disclosed.


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