The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9379702 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 28, 2016

Filed:

Sep. 16, 2014
Applicant:

Ipgoal Microelectronics (Sichuan) Co., Ltd., Chengdu, CN;

Inventors:

Baoding Yang, Chengdu, CN;

Zhengxian Zou, Chengdu, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 27/02 (2006.01); H03K 5/00 (2006.01); H03K 17/00 (2006.01); H03K 17/687 (2006.01); G11C 11/00 (2006.01); H03K 17/14 (2006.01); H03K 17/16 (2006.01);
U.S. Cl.
CPC ...
H03K 17/6871 (2013.01); G11C 11/00 (2013.01); H03K 17/145 (2013.01); H03K 17/161 (2013.01); H03K 2217/0054 (2013.01);
Abstract

A sample and hold switch circuit includes a clock generation sub-circuit, a gate voltage bootstrap unit, a sampling Field Effect Transistor, a holding capacitor and a substrate selection sub-circuit which is connected with a signal input terminal, a signal output terminal and a substrate of the sampling Field Effect Transistor and arranged for selecting the signal input terminal or the signal output terminal to connect with the substrate of the sampling Field Effect Transistor according to the voltages of the analog signal inputted and the analog signal outputted. The sample and hold switch circuit reduces nonlinearity of the sampling Field Effect Transistor caused by its gate-source voltage changing with input signal, and eliminates bulk effect of the sampling Field Effect Transistor, thereby improving linearity of the sampling Field Effect Transistor, and extending dynamic range of the sample and hold switch circuit.


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