The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2016

Filed:

Mar. 16, 2012
Applicants:

Steven J Simske, Fort Collins, CO (US);

Malgorzata M Sturgill, Fort Collins, CO (US);

Matthew D Gaubatz, Seattle, WA (US);

Masoud Zavarehi, Corvallis, OR (US);

Paul S Everest, Albany, OR (US);

Inventors:

Steven J Simske, Fort Collins, CO (US);

Malgorzata M Sturgill, Fort Collins, CO (US);

Matthew D Gaubatz, Seattle, WA (US);

Masoud Zavarehi, Corvallis, OR (US);

Paul S Everest, Albany, OR (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06Q 50/18 (2012.01);
U.S. Cl.
CPC ...
G06K 9/00577 (2013.01); G06K 9/00536 (2013.01); G06K 9/46 (2013.01); G06Q 50/184 (2013.01); G06K 2009/0059 (2013.01);
Abstract

Methods, and apparatus for performing methods, for classifying an image. Methods include determining a corresponding set of metrics for each region of two or more regions of a pattern of regions of an image, and classifying the image in response to at least the corresponding set of metrics for each of the two or more regions of the pattern of regions.


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