The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2016
Filed:
May. 11, 2011
Kenji Tamaki, Kawasaki, JP;
Kenji Tamaki, Kawasaki, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
An abnormality monitoring process milt () divides sensor data collected from a monitoring-target apparatus () into sensor data for each of a plurality of condition modes based on a condition-mode transition point detected by a condition-mode transition point detecting process unit (), and sorts the divided sensor data into a plurality of groups. Next, for each condition mode and each group, each piece of sensor data is compared with past statistic data, thereby detecting an abnormality. A causal diagnosis process unit () diagnoses an abnormality cause using link models before and after an abnormality is detected built based on a correlation coefficient between two pieces of sensor data in each group.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile