The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2016

Filed:

Sep. 18, 2014
Applicants:

Andreas Simon Schmitt, Kaiserslautern, DE;

Klaus Ziegler, Neidenstein, DE;

Fabian Vetter, St. Leon-Rot, DE;

Johannes Marbach, Schwetzingen, DE;

Inventors:

Andreas Simon Schmitt, Kaiserslautern, DE;

Klaus Ziegler, Neidenstein, DE;

Fabian Vetter, St. Leon-Rot, DE;

Johannes Marbach, Schwetzingen, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3616 (2013.01); G06F 11/3664 (2013.01);
Abstract

In an example embodiment, static code analysis is performed by designating a first portion of the computer code as base line code. A check run is then performed on the base line code, resulting in one or more findings, with each finding identifying a flaw in the base line code discovered by the check run. The one or more findings may then be designated as a base line. Then a subsequent check run on a modified version of the computer code is performed, resulting in one or more subsequent findings. The one or more findings of the base line are then subtracted from the one or more subsequent findings, resulting in a modified version of the one or more subsequent findings. The modified version of the one or more subsequent findings may then be displayed on a display.


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