The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2016

Filed:

Aug. 30, 2013
Applicant:

Amazon Technologies, Inc., Reno, NV (US);

Inventors:

Raghav Kishor Phadke, Seattle, WA (US);

Anderson Kailodge Quach, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Reno, NV (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01);
Abstract

This disclosure describes systems, methods, and computer-readable media related to testing tools for devices. In some embodiments, input may be received by a user device from a user. The input may include semantic inputs and analysis parameters. The semantic inputs may be converted to test events. The test events may be transmitted to a device for testing. The user device may receive a first set of data from the device and a second set of data from a camera. The second set of data may be processed. Test results may be generated based at least in part on the analyzed first set of data and the processed second set of data. The generated test results may be presented to the user.


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