The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2016
Filed:
Mar. 11, 2014
Hyundai Motor Company, Seoul, KR;
Kia Motors Corporation, Seoul, KR;
Hyundai Autron Company Ltd., Seongnam, Gyeonggi-do, KR;
Choong Seob Park, Gyeonggi-do, KR;
Ji Haeng Lee, Gyeonggi-do, KR;
Kang Hee Cho, Gyeonggi-do, KR;
Doo Jin Jang, Seoul, KR;
Hyundai Motor Company, Seoul, KR;
Kia Motors Corporation, Seoul, KR;
Hyundai Autron Company Ltd., Seongnam, Gyeonggi-do, KR;
Abstract
A serial communication test device, a system including the same, and a method thereof are provided, which relate to a technology that allows a master chip and a slave ship for Serial Peripheral Interface (SPI) communication to double-check data to increase reliability. The serial communication test device includes an interface that is configured to transmit and receive data to and from an external chip. A controller is configured to store data to be error-checked in a register to output the stored data to the external chip through the interface and to store data received from the external chip through the interface in a data storage unit. The controller compares the data stored in the register with the data stored in the data storage unit and determines whether the data stored in the register is substantially similar to data to be error-checked.