The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2016
Filed:
Jan. 17, 2013
Bruker Optik Gmbh, Ettlingen, DE;
Michael Juette, Karlsruhe, DE;
Axel Keens, Karlsruhe, DE;
Bruker Optik GmbH, Ettlingen, DE;
Abstract
An IR microscope () is constituted such that, in an optical viewing mode in a beam path of visible light (VIS-R, VIS-T), a first intermediate focus (ZW) is imaged onto a flat detector surface () of a camera. The IR microscope () is constituted such that, in the beam path of the visible light (VIS-R, VIS-T), the first intermediate focus (ZW) is imaged onto a second intermediate focus (ZW), and, in the second intermediate focus (ZW), a Mangin mirror () is disposed that corrects a field curvature of the Cassegrain objective (). The invention provides an IR microscope in which the field curvature generated by the Cassegrain objective is corrected in a simple manner in the optical viewing mode when detection is performed using a flat detector and without restricting the spectral range of the IR microscope.