The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2016

Filed:

Mar. 15, 2013
Applicant:

Fluke Corporation, Everett, WA (US);

Inventors:

David Lawrence Epperson, Everett, WA (US);

Glen Howard Vetter, Stanwood, WA (US);

Joseph V. Ferrante, Redmond, WA (US);

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/02 (2006.01); G06F 3/0488 (2013.01); G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 1/025 (2013.01); G06F 3/0488 (2013.01); G01R 13/02 (2013.01);
Abstract

In at least one embodiment, a handheld measurement system for receiving measurement data. The handheld measurement system generates a measurement image derived from the received measurement data. The handheld measurement system also generates a plurality of option images that each correspond to a particular option. A touch screen is coupled to the measurement device, and the touch screen displays the measurement image and the option images. The displayed option images are selectable, and the measurement device is configured to modify the measurement image in response to a selection.


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