The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2016
Filed:
Aug. 19, 2015
Ramot AT Tel Aviv University Ltd., Tel Aviv, IL;
Anima Cell Metrology, Inc., Bernardsville, NJ (US);
Orna Elroy-Stein, Tel-Aviv, IL;
Marcelo Ehrlich, Tel-Aviv, IL;
Sima Barhoom, Hod Hasharon, IL;
Zeev Smilansky, M.P. Emek Soreq, IL;
RAMOT at Tel Aviv University Ltd., Tel-Aviv, IL;
Anima Cell Metrology, Inc., Bernardsville, NJ (US);
Abstract
There are provided methods for detection and measurement of stress in a cell, the method including introducing a labeled tRNA into the cell and detecting a change in subcellular localization of the labeled tRNA in the cell, based on the signal emitted from the labeled tRNA. There are further provided methods and systems for the generation of a stress index of a living cell. There are further provided methods and systems for detection of stress in a living cell, comprising detection of changes in subcellular localization of labeled tRNA in a cell, wherein the detection is performed in real time.