The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2016
Filed:
May. 23, 2014
Varel International Ind., L.p., Carrollton, TX (US);
Federico Bellin, Tomball, TX (US);
Vamsee Chintamaneni, Houston, TX (US);
VAREL INTERNATIONAL IND., L.P., Carrollton, TX (US);
Abstract
A method of characterizing a quality of a polycrystalline diamond compact (PDC) cutter includes obtaining a PDC cutter that includes a leached layer and an unleached layer. The unleached layer is positioned adjacent to the leached layer, and the leached layer has at least a portion of a catalyst material removed from therein. The method further includes measuring capacitance values of the PDC cutter at multiple frequencies of an electrical signal provided to the PDC cutter by a capacitance measuring device to measure the capacitance values of the PDC cutter. The method also includes characterizing a quality of the PDC cutter based on a lowest capacitance value from among the capacitance values. Each capacitance value of the capacitance values is measured at a respective frequency of the multiple frequencies of the electrical signal.