The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2016

Filed:

Jun. 05, 2013
Applicant:

Sciemetric Instruments Inc., Kanata, CA;

Inventors:

Richard Michel Brine, Ottawa, CA;

Nathan Bernard Sheaff, Kanata, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/26 (2006.01); G05D 7/06 (2006.01);
U.S. Cl.
CPC ...
G01M 3/26 (2013.01); G05D 7/0629 (2013.01);
Abstract

Leak rate testing is an engineering challenge where on the one hand, engineers must meet strict leak rate standards on a wide range of products and systems from semiconductor packages through medical product packaging to chemical storage vessels and liquid/gas handling systems. On the other hand, they have to make the leak testing process low cost and independent of operator whilst in many applications making the process automated and fast as this step may otherwise become a manufacturing bottleneck. Accordingly embodiments of the invention address manufacturing requirements by providing for high accuracy flow based leak testing of large volumes, providing adaptive techniques for use during testing, providing equivalent circuit modeling techniques allowing optimization and parameter extraction to be simulated prior to manufacturing commitment, and providing for the automatic tuning of setup parameters.


Find Patent Forward Citations

Brine, Richard. (2016). Leak testing methods and systems (U.S. Patent No. 9377374). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9377374

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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