The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2016
Filed:
Feb. 29, 2012
Applicants:
Yong Weon Kim, San Diego, CA (US);
Leonel Ochoa Arellano, Poway, CA (US);
Inventors:
Yong Weon Kim, San Diego, CA (US);
Leonel Ochoa Arellano, Poway, CA (US);
Assignee:
Solar Turbines Incorporated, San Diego, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 17/00 (2006.01); G01K 3/04 (2006.01); G01K 11/06 (2006.01);
U.S. Cl.
CPC ...
G01K 17/00 (2013.01); G01K 3/04 (2013.01); G01K 11/06 (2013.01);
Abstract
An apparatus for measuring temperature parameters of a structure is provided. The apparatus comprises: a carrier including at least one receiving portion; and a plurality of temperature sensors disposed within the at least one receiving portion and secured to the receiving portion via a bonding medium, the sensors being distributed along at least one direction of the carrier and configured to measure and record temperature information through microstructural changes corresponding to temperatures experienced by the respective sensors.