The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2016
Filed:
Aug. 27, 2013
Ihi Corporation, Tokyo, JP;
Ihi Machinery and Furnace Co., Ltd., Tokyo, JP;
Kazuhiko Katsumata, Tokyo, JP;
Junji Inoue, Tokyo, JP;
Takahisa Shimada, Tokyo, JP;
Shinya Kudo, Tokyo, JP;
Ami Ueda, Tokyo, JP;
IHI Corporation, Tokyo, JP;
IHI Machinery and Furnace Co., Ltd., Tokyo, JP;
Abstract
A device is provided with a measurement window, which is provided in a heat treat furnace and which permits direct visual observation of a surface to be measured of a heat-treated workpiece, and a temperature sensor, which is provided outside the measurement window and which is capable of carrying out noncontact measurement of the surface temperature of the surface to be measured through the measurement window. The temperature sensor has a measurement wavelength range in which the absorptivity by water is low (e.g., 1.95 μm to 2.5 μm). Further, the measurement window is composed of a window material having a high transmittance in the measurement wavelength range (e.g., germanium).