The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2016

Filed:

Dec. 05, 2014
Applicant:

Bioptigen, Inc., Morrisville, NC (US);

Inventors:

Eric L. Buckland, Hickory, NC (US);

Al-Hafeez Z. Dhalla, Durham, NC (US);

Nestor O. Farmiga, Rochester, NY (US);

Mehran Ghofrani, Cary, NC (US);

Robert H. Hart, Cary, NC (US);

Andrew Murnan, Saratoga Springs, NY (US);

Christopher Saxer, Cary, NC (US);

Assignee:

Bioptigen, Inc., Morrisville, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02087 (2013.01); A61B 3/102 (2013.01); G01B 9/02028 (2013.01); G01B 9/02044 (2013.01); G01B 9/02091 (2013.01);
Abstract

An optical coherence tomography (OCT) system including a source of broadband optical radiation and a beamsplitter coupled to the source is provided. The beamsplitter divides the source radiation into a reference path and a sample path. The reference path includes an optical switch to switch the reference path between a first path having a first reference reflector at a first reference optical path length and a second path having a second reference reflector at a second reference optical path length, different from the first reference optical path length. The system further includes a beam combiner that mixes source radiation reflected from a subject in the sample path with source radiation returned from the first reference reflector during a first time interval and the second reference reflector during a second time interval. A detection system detects a first wavelength dependent interferogram during the first time interval and a second wavelength dependent interferogram during the second time interval. A processor preconditions the first and second wavelength dependent interferograms; multiples the first preconditioned wavelength dependent interferogram and the second preconditioned wavelength dependent interferogram; and computes a first A-scan from the first wavelength dependent interferogram; a second A-scan from the second wavelength dependent interferogram; a spatial offset between the first and second A-scans derived from the multiplicative product of the preconditioned first and second wavelength dependent interferograms; and a combined A-scan from the first and second A-scans.


Find Patent Forward Citations

Loading…