The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2016
Filed:
Nov. 17, 2011
Yong Tian, Peoria, IL (US);
Douglas Alexander Rebinsky, Peoria, IL (US);
Christopher Anthony Kinney, Iuka, MS (US);
Kegan Luick, Corinth, MS (US);
Yong Tian, Peoria, IL (US);
Douglas Alexander Rebinsky, Peoria, IL (US);
Christopher Anthony Kinney, Iuka, MS (US);
Kegan Luick, Corinth, MS (US);
Caterpillar Inc., Peoria, IL (US);
Abstract
A method of configuring an eddy current detector to measure a thickness of a coating on a substrate includes measuring an impedance of the coated substrate, and establishing an impedance plane plot using a computer. The method may also include determining a rotation angle. The rotation angle may be an angle of rotation of the impedance plane plot that will make the inductive reactance component of the impedance substantially insensitive to substrate electrical conductivity within a coating thickness range. The method may further include establishing a calibration curve that is substantially insensitive to substrate electrical conductivity using the rotation angle. The calibration curve may be a curve that relates the inductive reactance component of the impedance to coating thickness.