The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2016
Filed:
Apr. 12, 2011
Akira Morikawa, Nagoya, JP;
Kae Yamamura, Nagoya, JP;
Akihiko Suda, Seto, JP;
Naoki Takahashi, Nagoya, JP;
Oji Kuno, Nagoya, JP;
Takeshi Nobukawa, Toyota, JP;
Akiya Chiba, Kakegawa, JP;
Ryuta Fujii, Kakegawa, JP;
Akira Morikawa, Nagoya, JP;
Kae Yamamura, Nagoya, JP;
Akihiko Suda, Seto, JP;
Naoki Takahashi, Nagoya, JP;
Oji Kuno, Nagoya, JP;
Takeshi Nobukawa, Toyota, JP;
Akiya Chiba, Kakegawa, JP;
Ryuta Fujii, Kakegawa, JP;
KABUSHIKI KAISHA TOYOTA CHUO KENKYUSHO, Aichi, JP;
TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota, JP;
CATALER CORPORATION, Kakegawa, JP;
Abstract
A ceria-zirconia base composite oxide contains a composite oxide of ceria and zirconia. In the ceria-zirconia base composite oxide, a content ratio between cerium and zirconium in the composite oxide is in a range from 43:57 to 48:52 in terms of molar ratio ([cerium]:[zirconium]). An intensity ratio of a diffraction line at 2θ=14.5° to a diffraction line at 2θ=29° {I(14/29) value} and an intensity ratio of a diffraction line at 2θ=28.5° to the diffraction line at 2θ=29° {I(28/29) value}, which are calculated from an X-ray diffraction pattern obtained by an X-ray diffraction measurement using CuKa after heating under a temperature condition of 1100° C. in air for 5 hours, respectively satisfy the following conditions: I(14/29) value≧0.015, and I(28/29) value≦0.08.