The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2016

Filed:

Mar. 20, 2014
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Atsushi Nagahara, Azumino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D 3/12 (2006.01); B31D 1/02 (2006.01); B41J 3/407 (2006.01); B41J 11/66 (2006.01);
U.S. Cl.
CPC ...
B31D 1/021 (2013.01); B31D 1/027 (2013.01); B41J 3/4075 (2013.01); B41J 11/663 (2013.01); B41J 11/666 (2013.01);
Abstract

A label production apparatus includes: a printing unit; a test unit; and a post-process unit configured to cut a material in accordance with test results by the test unit. In the stated label production apparatus, each of a label images includes a common image portion and a changeable image portion. Further, in the label production apparatus, the post-process unit cuts a first base material using a first cut-line, the common image portion and the changeable image portion of a label image that has been detected to have no print defect, whereas the post-process unit cuts the first base material using a second cut-line for not cutting out the common image portion from the first base material but cutting out from the first base material at least part of the changeable image portion of a label image that has been detected to have a print defect.


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