The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2016
Filed:
Nov. 11, 2015
Applicants:
Timothy Ruchti, Gurnee, IL (US);
Alan Abul-haj, Mesa, AZ (US);
Kevin Hazen, Gilbert, AZ (US);
Inventors:
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 5/02 (2006.01); A61B 5/1455 (2006.01); A61B 5/145 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1455 (2013.01); A61B 5/14532 (2013.01); A61B 5/6801 (2013.01); A61B 2562/04 (2013.01); A61B 2562/046 (2013.01);
Abstract
A noninvasive analyzer apparatus and method of use thereof is described using a plurality of sample illumination zones optically coupled to at least two optically stacked two-dimensional optical filter arrays. Sectioned pixels and/or zones of a detector array are optionally filtered for different light throughput and/or are passed through various pathlengths using the stacked two-dimensional optical filter arrays. Resulting pathlength resolved/wavelength controlled groups of spectra are subsequently analyzed to determine an analyte property.