The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2016
Filed:
Aug. 26, 2015
Raven Industries, Inc., Sioux Falls, SD (US);
Robert Leonard Nelson, Jr., Austin, TX (US);
Raven Industries, Inc., Sioux Falls, SD (US);
Abstract
Systems and techniques for row guidance parameterization with Hough transform are described herein. An electronic representation of a field (ERF) can be received. The ERF can include a set of feature sets including one of a set of crop row features or a set of furrow features. A first parameter space can be produced by applying a slope-intercept Hough transform (SLIHT) to members of a feature set. Peaks in the first parameter space can be identified. A second parameter space can be produced by application of the SLIHT to the peaks. A vanishing point can be calculated based on a vanishing point peak in the second parameter space. A track-angle error can be calculated from the vanishing point.