The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

Sep. 05, 2013
Applicant:

Hitachi Aloka Medical, Ltd., Mitaka-shi, Tokyo, JP;

Inventors:

Isao Takahashi, Tokyo, JP;

Naoyuki Yamada, Tokyo, JP;

Hisaki Mori, Tokyo, JP;

Tatsuo Izumida, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/02 (2006.01); H04N 5/30 (2006.01);
U.S. Cl.
CPC ...
H04N 5/30 (2013.01);
Abstract

A radiation measurement apparatus includes: a radiation detector which detects incoming radiations; a measurement processor which measures a distribution of a radiation source in an object on the basis of detection signals inputted from the radiation detector; an optical camera which takes an optical image of an object existing in the field of view; a controller which generates synthesized images by superimposing the distribution of the one or more radiation sources and the optical image; a rotation unit which changes the objective field of radiation measurement by automatic or manual rotation; and a controller which causes a display unit to display the multiple synthesized images in association with rotation angles in the automatic or manual rotation.


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