The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2016
Filed:
Sep. 02, 2014
Texas Instruments Incorporated, Dallas, TX (US);
Zigang Yang, Plano, TX (US);
Raul Blazquez, Mountain View, CA (US);
Hardik Prakash Gandhi, Sunnyvale, CA (US);
Xiaohan Chen, Sunnyvale, CA (US);
Lars Jorgensen, Royal Oaks, CA (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A digital pre-distortion component includes: a first capturing component that captures a first sample set of data; a first generating component that generates a first change matrix associated with a portion of the first sample set of data; a first memory component that stores the first change matrix; a second capturing component that captures a second sample set of data; a second generating component that generates a second change matrix associated with a portion of the second sample set of data; a second memory component that stores the second change matrix; a third capturing component that captures a third sample set of data; a third generating component that generates a third change matrix associated with a portion of the third sample set of data; a comparing component that compares the third change matrix with the first change matrix to obtain a first comparison, and compares the third change matrix with the second change matrix to obtain a second comparison; and an adapting component that adapts the digital pre-distortion component with the third sample set of data based on one of the first comparison and the second comparison.