The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2016
Filed:
Oct. 29, 2013
Nvidia Corporation, Santa Clara, CA (US);
NVIDIA Corporation, Santa Clara, CA (US);
Abstract
A method and system for testing a memory is provided in the present invention. The method includes the following steps. Each of at least one address bit to be tested of the memory is set to a fixed value. Current test data is written into memory unit(s) of the memory which the set address bit(s) correspond(s) to. Current read back data is read from the memory unit(s) which the set address bit(s) correspond(s) to. The current test data is compared with the current read back data. It is judged whether there is any signal integrity problem in unset address bit(s) of the memory according to the comparison result of the current test data and the current read back data, in order to determine fault address bit(s). The method and system for testing a memory provided by the present invention may determine fault address bit(s) of the memory simply and quickly.