The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2016
Filed:
Aug. 16, 2013
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Pradip Bose, Yorktown Heights, NY (US);
Alan Gara, Mount Kisco, NY (US);
Hans M. Jacobson, White Plains, NY (US);
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01); G11C 29/08 (2006.01); G01R 31/3185 (2006.01); G01R 31/30 (2006.01); G11C 29/06 (2006.01); G01R 31/317 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/08 (2013.01); G01R 31/30 (2013.01); G01R 31/318525 (2013.01); G11C 29/06 (2013.01); G01R 31/3171 (2013.01); G11C 2029/0409 (2013.01);
Abstract
A method of testing a circuit includes halting a flow of normal data through the circuit, running test data through the circuit while subjecting the circuit to a stress condition, and determining whether a hard error exists in the circuit based on the running of the test data.