The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

May. 19, 2015
Applicant:

Sandisk 3d Llc, Milpitas, CA (US);

Inventors:

Perumal Ratnam, Fremont, CA (US);

Christopher Petti, Mountain View, CA (US);

Tianhong Yan, Saratoga, CA (US);

Assignee:

SANDISK TECHNOLOGIES INC., Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/02 (2006.01); G11C 13/00 (2006.01); G06F 11/10 (2006.01); H01L 27/24 (2006.01); H01L 29/786 (2006.01); H01L 45/00 (2006.01); G11C 16/08 (2006.01); G11C 16/10 (2006.01); G11C 16/24 (2006.01); G11C 16/26 (2006.01); G11C 7/12 (2006.01); G11C 7/18 (2006.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 13/004 (2013.01); G06F 11/1048 (2013.01); G11C 7/12 (2013.01); G11C 7/18 (2013.01); G11C 13/0007 (2013.01); G11C 13/0021 (2013.01); G11C 13/0026 (2013.01); G11C 13/0028 (2013.01); G11C 13/0033 (2013.01); G11C 13/0069 (2013.01); G11C 13/0097 (2013.01); G11C 16/08 (2013.01); G11C 16/10 (2013.01); G11C 16/24 (2013.01); G11C 16/26 (2013.01); G11C 29/025 (2013.01); G11C 29/028 (2013.01); H01L 27/249 (2013.01); H01L 27/2436 (2013.01); H01L 27/2481 (2013.01); H01L 29/786 (2013.01); H01L 45/122 (2013.01); H01L 45/1246 (2013.01); G11C 2029/1204 (2013.01); G11C 2213/71 (2013.01); G11C 2216/10 (2013.01);
Abstract

Methods for reducing leakage currents through unselected memory cells of a memory array during a memory operation are described. In some cases, the leakage currents through the unselected memory cells of the memory array may be reduced by setting an adjustable resistance bit line structure connected to the unselected memory cells into a non-conducting state. The adjustable resistance bit line structure may comprise a bit line structure in which the resistance of an intrinsic (or near intrinsic) polysilicon portion of the bit line structure may be adjusted via an application of a voltage to a select gate portion of the bit line structure that is not directly connected to the intrinsic polysilicon portion. The intrinsic polysilicon portion may be set into a conducting state or a non-conducting state based on the voltage applied to the select gate portion.


Find Patent Forward Citations

Loading…