The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

Nov. 15, 2012
Applicant:

Dolby Laboratories Licensing Corporation, San Francisco, CA (US);

Inventors:

Michael John Grant, San Francisco, CA (US);

Michael Donald Hoffmann, Pacifica, CA (US);

Sachin Nanda, San Francisco, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G10L 19/008 (2013.01); G10L 19/16 (2013.01); H04H 60/73 (2008.01); H04N 21/84 (2011.01); G10L 25/60 (2013.01); H04N 21/439 (2011.01);
U.S. Cl.
CPC ...
G10L 19/008 (2013.01); G10L 19/167 (2013.01); G10L 25/60 (2013.01); H04H 60/73 (2013.01); H04N 21/439 (2013.01); H04N 21/84 (2013.01);
Abstract

A method including the steps of assessing at least two metadata parameters associated with an audio bitstream (e.g., an encoded Dolby Digital (AC-3), Dolby Digital Plus, or Dolby E bitstream), determining individual metadata parameter quality values, each of the individual metadata parameter quality values indicative of quality (e.g., correctness) of a different one of the at least two metadata parameters, and generating data indicative of a metadata score, where the metadata score is a value determined by a combination (e.g., a linear combination or other weighted combination) of the individual metadata parameter quality values. The metadata score is indicative of overall quality (e.g., correctness) of the at least two metadata parameters. Another aspect is a system (e.g., a test device or measurement device, or another test or measurement product, or a processor) configured (e.g., programmed) to perform any embodiment of the method.


Find Patent Forward Citations

Loading…