The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

Sep. 20, 2011
Applicants:

Masahiro Ogawa, Susono, JP;

Toshiki Kindo, Yokohama, JP;

Ryuji Funayama, Yokohama, JP;

Akio Fukamachi, Hadano, JP;

Inventors:

Masahiro Ogawa, Susono, JP;

Toshiki Kindo, Yokohama, JP;

Ryuji Funayama, Yokohama, JP;

Akio Fukamachi, Hadano, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G08G 1/16 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00791 (2013.01); G06K 9/00335 (2013.01); G06K 9/00348 (2013.01); G06K 9/00805 (2013.01); G06K 9/4604 (2013.01); G06K 9/4671 (2013.01); G08G 1/166 (2013.01); B60W 2420/40 (2013.01); B60W 2550/10 (2013.01);
Abstract

The invention detects a change in a subject by detecting the subject from an image, acquiring a feature quantity distribution that indicates shape information of the detected subject, accumulating the shape information that is indicated by the acquired feature quantity distribution and comparing the shape information a predetermined period of time before with the current shape information by using the accumulated shape information. Here, the invention acquires the feature quantity distribution of the subject from a processing target area extracted from an image area that includes the subject. The invention detects a change in the subject by using accumulated shape change information acquired from the shape information. The invention detects a change in the subject by using averaged shape change information obtained by averaging the shape change information.


Find Patent Forward Citations

Ogawa, Masahiro. (2016). Subject change detection system and subject change detection method (U.S. Patent No. 9373042). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9373042

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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