The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2016
Filed:
Jun. 27, 2013
University of Tsukuba, Tsukuba-shi, Ibaraki, JP;
Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;
Hiroyuki Kudo, Tsukuba, JP;
Naoya Saito, Tsukuba, JP;
Yukio Ueda, Hamamatsu, JP;
Kenji Yoshimoto, Hamamatsu, JP;
Yutaka Yamashita, Hamamatsu, JP;
UNIVERSITY OF TSUKUBA, Tsukuba-shi, Ibaraki, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
In measurement data selection, when a vector composed of measurement data obtained for respective combinations of light emitting positions, light detection positions, and resolving times in a time-resolved waveform is given as y, a vector in which pixel values of learning image data are components is given as x, and a system matrix for calculating internal image data from the measurement data is given as A, the vector y which meets the conditional expressions (2) and (3)min∥  (2),∥≦ε  (3)or the conditional expression (4)min(∥)  (4)is determined, and upon measurement of a subject, only the measurement data corresponding to nonzero components of the vector y is used to prepare the internal image data.