The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

Dec. 20, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Dave Zeryck, Portland, OR (US);

Denis Vilfort, Danville, CA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0631 (2013.01); G06F 3/0619 (2013.01); G06F 3/0689 (2013.01); G06F 11/3034 (2013.01); G06F 11/3414 (2013.01);
Abstract

A method, computer program product, and computing system for defining a storage pool for a storage system being designed that includes a plurality of storage tiers. Each storage tier has a different level of performance. A first workload is defined for the storage system, wherein the first workload includes: a first target skew factor, a first capacity requirement, and a first IOPS requirement. A first density function is generated based, at least in part, upon the first target skew factor. The first workload is applied to the storage pool, thus defining a first allocated workload. A distribution of the first IOPS requirement amongst the plurality of storage tiers included within the storage pool is determined based, at least in part, upon the first allocated workload and the first density function.


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