The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

Feb. 26, 2015
Applicant:

Brother Kogyo Kabushiki Kaisha, Nagoya-shi, Aichi-ken, JP;

Inventors:

Hitoshi Fujino, Tajimi, JP;

Yoshifumi Nakamura, Ama, JP;

Hiroyuki Ominato, Nagoya, JP;

Hidetaka Hoshino, Aichi, JP;

Assignee:

BROTHER KOGYO KABUSHIKI KAISHA, Nagoya-Shi, Aichi-Ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/043 (2006.01); G02B 26/12 (2006.01);
U.S. Cl.
CPC ...
G03G 15/043 (2013.01); G02B 26/125 (2013.01);
Abstract

In a scanning optical apparatus including a light source, a light deflector having a reflecting surface, and a single scanning lens, a light flux deflected in a main scanning direction is focused on an image surface. The reflecting and image surfaces are conjugate to each other with respect to a sub scanning direction, Bmax×Bmin>0, and Dmax×Dmin<0 where Bmax and Bmin are a maximum value and a minimum value, respectively, of paraxial focal points, Dmax and Dmin are a maximum value and a minimum value, respectively, of midpoints of focal depth in the sub scanning plane, the values being determined with reference to the image surface, wherein the value of the image surface is 0 and the values on a farther-from-the-scanning-lens side behind the image surface have positive values.


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