The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2016
Filed:
Dec. 29, 2011
Applicant:
Holger Birk, Meckesheim, DE;
Inventor:
Holger Birk, Meckesheim, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/12 (2006.01); H01J 3/14 (2006.01); G06K 9/32 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0036 (2013.01); G02B 21/365 (2013.01); G02B 21/0048 (2013.01); G02B 21/367 (2013.01);
Abstract
In order to identify scan coordinate values (φ, θ) for operating a scanning unit () of a confocal scanning microscope (), spherical scan coordinate values (φ, θ) are identified, as a function of Cartesian image coordinates (X, Y) of image points of an image () to be created of a sample (), with the aid of a coordinate transformation of the Cartesian image coordinate values (X, Y) into a spherical coordinate system. The scanning unit () is operated as a function of the spherical scan coordinate values (φ, θ).