The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

Mar. 14, 2011
Applicant:

Ryohei Tanaka, Osaka, JP;

Inventor:

Ryohei Tanaka, Osaka, JP;

Assignee:

DAIHEN Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 21/01 (2006.01);
U.S. Cl.
CPC ...
G01R 35/00 (2013.01); G01R 21/01 (2013.01); G01R 35/005 (2013.01);
Abstract

A method is provided for evaluating the reliability of an electrical power measuring device for measuring high-frequency electrical power. To build an evaluation system, the measuring device, together with a reference electrical power measuring device, is arranged between a high-frequency power supply device and an artificial reproduction load, which includes an impedance conversion device and a reference load. Using this system, an uncertainty range of an electrical power measured value measured by the measuring device is calculated, according to a prescribed calculation formula, from the electrical power measured value, and a judgment is made as to whether or not the electrical power measured value measured by the measuring device is within the uncertainty range. If it is within the uncertainty range, the measuring device is evaluated as being reliable, while if it is not within the uncertainty range, the measuring device is evaluated as being unreliable.


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