The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

Jun. 21, 2013
Applicant:

Audi Ag, Ingolstadt, DE;

Inventors:

Sami Zaki, Regensburg, DE;

Niklas Schalli, München, DE;

Florian Steinlechner, Ingolstadt, DE;

Assignee:

AUDI AG, Ingolstadt, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); B60L 3/12 (2006.01); B60R 16/023 (2006.01); G01R 31/40 (2014.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
G01R 31/006 (2013.01); B60L 3/12 (2013.01); B60R 16/0232 (2013.01); G01R 31/02 (2013.01); G01R 31/021 (2013.01); G01R 31/40 (2013.01);
Abstract

A diagnostic device for checking a control signal line between a control device of a motor vehicle and a motor-vehicle-side charging connection for a battery of the motor vehicle, includes a first resistor disposed at the charging connection and connecting the control signal line to ground, a second resistor connected in parallel with first resistor to form a parallel circuit, an evaluation device associated with the control device and comprising a current source and/or a voltage source for supplying a corresponding current or voltage outside a charging operation, and a diode connected in series with the first and second resistors and blocking a current flow from ground to the control signal line. The evaluation device is configured to measure, by using the first and second resistor, a current indicating a control signal line defect or a voltage indicating a control signal line defect.


Find Patent Forward Citations

Loading…